| The Tangram project focuses on a test methodology, supported with processes and tools, for complex systems. The target is a test approach that supports heterogeneity and multi-technology testing for early validation, model-based validation, and automatic test generation and diagnostics. The ASML wafer scanners are taken as case study and act as drivers for the project. A background in one of the basic disciplines (mechanics, electronics, computer science) and an open mind to exploring and applying science in an industrial environment are essential. |
