| A conducting film of only a few nanometers thickness shows an extremely steep conductivity dependence of the layer thickness and morphology. Conductivity of such ultra thin films just before or after percolation is a topic that was studied for many decades but progress was seriously hampered by technological (manufacturing) control. In this research work, the physical and electrical properties of ultra thin conducting films, both continuous and percolated, will be manufactured using ALD techniques. The potential application of such layers in several advanced electronic devices is also assessed. |
